Advances in Imaging and Electron Physics, Volume 116 (Advances in Imaging and Electron Physics)
Editorial Reviews
Review
"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics and Electron Physics, results in a volume that will be a handsome addition to any bookshelf."
--MRS BULLETIN
"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical and Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."
--J.A. Chapman in LABORATORY PRACTICE
--This text refers to the
Hardcover
edition.
Book Description
Advances in Imaging and Electron Physics merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Advances in Imaging and Electron Physics, Volume 116 (Advances in Imaging and Electron Physics)
Advances in Imaging and Electron Physics, Volume 116 (Advances in Imaging and Electron Physics),Peter W. Hawkes,Academic Press,0120147580,Electronic Engineering (General),Electronics - Optoelectronics,Engineering - Electrical & Electronic,Imaging Systems,Optics,Physics,Science,Science/Mathematics,Technology,Electronic devices & materials,Image processing,Science / Physics,Science-Optics,Technology / Engineering / Mechanical,Technology-Imaging Systems
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