Editorial Reviews
Review
'The authors give an excellent account of all the basic research undertaken in the area of defects in semiconductors particularly during the last 15 years. They assume that the reader has some basic knowledge of semiconductor physics. The text is presented in a very readable style and it contains over 100 figures. The book should be of direct interest to those scientists actively engaged in both fundamental and applied semiconductor physics. It is very readable and is of a high standard throughout.' C. A. Bates, Contemporary Physics
Book Description
This book gives a complete overview of the properties of deep-level, localized defects in semiconductors. Such comparatively long-lived (or metastable) defects exhibit complex interactions with the surrounding material, and can significantly affect the performance and stability of certain semiconductor devices. After an introductory discussion of metastable defects, the authors present properties of DX and EL2 centers in IIISHV compounds. They also deal with additional crystalline materials before giving a detailed description of the properties and kinetics of photo-induced defects in amorphous semiconductors. The book closes with an examination of the effects of photo-induced defects in a range of practical applications. The book will be of great use to graduate students and researchers interested in the physics and materials science of semiconductors.
Photo-induced Defects in Semiconductors (Cambridge Studies in Semiconductor Physics and Microelectronic Engineering)
Photo-induced Defects in Semiconductors (Cambridge Studies in Semiconductor Physics and Microelectronic Engineering),David Redfield,Richard H. Bube,Haroon Ahmad,Michael Pepper,Alec Broers,Cambridge University Press,0521461960,Defects,Electricity,Electronics - Semiconductors,Material Science,Photochemistry,Physics,Science,Science/Mathematics,Semiconductor Physics,Semiconductors,Solid State Physics,Condensed matter physics (liquids & solids),Electricity, magnetism & electromagnetism,Science / Physics,Semiconductors--Defects
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